Fujistu Limited

Shin Hwei Tan

Mukul Ranjan Prasad

Hiroaki Yoshida

According to an aspect of an embodiment, one or more systems or methods may be configured to locate a fault in a software program using a test suite. The systems or methods may be further configured to modify, using a repair template, the software program in response to locating the fault. In addition, the systems or methods may be configured to determine whether the modification satisfies an anti-pattern condition. The anti-pattern condition may indicate whether the modification is improper. The systems or methods may also be configured to disallow the modification in response to the modification satisfying the anti-pattern condition or perform further testing on the software program, as modified, in response to the modification not satisfying the anti-pattern condition.

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Sunnyvale, CA, United States of America

Shin Hwei Tan