The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Aug. 25, 2015
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Hiroaki Yoshida, Cupertino, CA (US);
Shin Hwei Tan, Sunnyvale, CA (US);
Mukul R. Prasad, San Jose, CA (US);
FUJISTU LIMITED, Kawasaki, JP;
Abstract
According to an aspect of an embodiment, one or more systems or methods may be configured to locate a fault in a software program using a test suite. The systems or methods may be further configured to modify, using a repair template, the software program in response to locating the fault. In addition, the systems or methods may be configured to determine whether the modification satisfies an anti-pattern condition. The anti-pattern condition may indicate whether the modification is improper. The systems or methods may also be configured to disallow the modification in response to the modification satisfying the anti-pattern condition or perform further testing on the software program, as modified, in response to the modification not satisfying the anti-pattern condition.