Tokyo, Japan

Shigeyuki Kakuta

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Yokogawa Electric Corporation. Active years: 2010-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigeyuki Kakuta. Retrieved from https://idiyas.com/inventor/shigeyuki-kakuta

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 2.7

ph-index = 1


Location History:

  • Musashino, JP (2010)
  • Tokyo, JP (2013)

Company Filing History:


Years Active: 2010-2013

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2 patents (USPTO):Explore Patents

Title: Shigeyuki Kakuta: Innovator in Photometric Measurement Technology

Introduction

Shigeyuki Kakuta is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of photometric measurement technology. With a total of 2 patents, his work has advanced the capabilities of measurement apparatuses in various applications.

Latest Patents

Kakuta's latest patents include a multichannel photometric measurement apparatus and an apparatus and method for measuring film thickness. The multichannel photometric measurement apparatus features a single signal generator that produces an initial signal containing a harmonic component. This design allows for the collective generation of multiple modulation signals. The apparatus includes a light-emitting device with several light sources, each driven by different modulation signals. Additionally, it has a light detector that identifies various types of light emitted from the device, along with discriminating means for analyzing the detected signals across different frequency domains.

The film thickness measuring apparatus utilizes a light source that emits white light onto a multilayer thin film. It incorporates a spectroscope to disperse the reflected light, obtaining reflectance spectrums. The computation section of this apparatus includes a setting section for defining wavelength ranges, a first conversion section for obtaining wavenumber range reflectance spectrums, a second conversion section for converting these into power spectrums, and a calculation section that determines the film thickness based on the power spectrums.

Career Highlights

Shigeyuki Kakuta is currently employed at Yokogawa Electric Corporation, where he continues to innovate in measurement technologies. His work has been instrumental in enhancing the precision and efficiency of photometric measurements.

Collaborations

Kakuta has collaborated with notable colleagues, including Kazufumi Nishida and Kumiko Horikoshi. Their combined expertise has contributed to the development of advanced measurement solutions.

Conclusion

Shigeyuki Kakuta's contributions to photometric measurement technology exemplify his innovative spirit and dedication to advancing scientific understanding. His patents reflect a commitment to improving measurement techniques, making a lasting impact in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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