The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Jul. 20, 2011
Kumiko Horikoshi, Tokyo, JP;
Yasushi Ichizawa, Tokyo, JP;
Shigeyuki Kakuta, Tokyo, JP;
Kazufumi Nishida, Tokyo, JP;
Kumiko Horikoshi, Tokyo, JP;
Yasushi Ichizawa, Tokyo, JP;
Shigeyuki Kakuta, Tokyo, JP;
Kazufumi Nishida, Tokyo, JP;
Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;
Abstract
A multichannel photometric measurement apparatus according to one embodiment includes: a single signal generator for generating an initial signal, the initial signal containing a harmonic component for collectively generating a plurality of modulation signals; a light emitting device including a plurality of light sources that are respectively drivable by each of the plurality of modulation signals having different frequencies; a light detector for detecting a plurality of kinds of light emitted from the light emitting device; and discriminating means for discriminating a detected signal output from the light detector per frequency domain of each of the different frequencies for each of the modulation signals.