Tokyo, Japan

Shigeru Munekawa


Average Co-Inventor Count = 1.5

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1990-2016

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3 patents (USPTO):Explore Patents

Title: Shigeru Munekawa: Innovator in X-ray Technology

Introduction

Shigeru Munekawa is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of X-ray technology, holding a total of 3 patents. His work focuses on developing compact and efficient X-ray apparatuses that enhance measurement capabilities.

Latest Patents

One of his latest patents is a "Method and its apparatus for X-ray diffraction." This invention aims to create a compact and lightweight X-ray diffraction apparatus that does not require a goniometer. The apparatus includes a first and a second X-ray irradiating unit that direct shaped X-rays onto the same region of the sample from different angles. It also features an X-ray detecting unit that captures both the first and second diffracted X-rays from the sample, along with a signal processing unit that analyzes the acquired data.

Another significant patent is the "X-ray stress measuring apparatus." This device is designed to measure stress on a sample using a pair of X-ray generating means that irradiate X-ray beams at a fixed angle on a plane inclined to the sample's surface. The apparatus includes an X-ray sensor that detects multiple Debye rings generated by the incident X-ray beams, allowing for precise stress measurement.

Career Highlights

Shigeru Munekawa has worked with prominent companies in the field, including Rigaku Corporation and Rigaku Denki Kabushiki Kaisha. His experience in these organizations has contributed to his expertise in X-ray technology and innovation.

Collaborations

He has collaborated with notable individuals in his field, including Hideo Toraya. Their joint efforts have further advanced the development of X-ray measurement technologies.

Conclusion

Shigeru Munekawa's contributions to X-ray technology through his innovative patents and collaborations highlight his role as a leading inventor in this specialized field. His work continues to influence advancements in measurement techniques and apparatus design.

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