Rigaku Corporation

Rigaku Denki Kabushiki Kaisha

Shigeru Munekawa

Hideo Toraya

In order to realize a compact and lightweight X-ray diffraction apparatus not requiring a goniometer, an apparatus for X-ray diffraction includes a first X-ray irradiating unit and a second X-ray irradiating unit that irradiate shaped X-rays on a same region of the surface of the sample from respective directions; an X-ray detecting unit that detects a first diffracted X-ray emanated from the region of the sample where the X-ray is irradiated by the first X-ray irradiating unit and a second diffracted X-ray emanated from the region of the sample where the X-ray is irradiated from the second X-ray irradiating unit; and an X-ray diffraction signal processing unit that processes a signal acquired by detecting the first diffracted X-ray and the second diffracted X-ray emanated from the same region of the sample with the X-ray detecting unit.

Method and its apparatus for x-ray diffraction

An X-ray stress measuring apparatus, for measuring stress on a sample, comprises: a pair of X-ray generating means (') for irradiating X-ray beams, determining an angle defined between the X-ray beams, mutually, at an arbitrary fixed angle, on a plane inclining by an angle desired with respect to a surface of the sample to be measured stress thereon; an X-ray sensor portion () for detecting plural numbers of Debye rings (C, C&#x2032;), which are generated by incident X-ray beams from said pair of X-ray generating means; and a battery () for supplying necessary electricity to each of parts of the apparatus, wherein said X-ray sensor portion is made up with only one (1) piece of a 2-dimensional X-ray detector () or a 1-dimensional X-ray detector (&#x2032;), and is disposed in a position where the plural numbers of Debye rings generated by the incident X-ray beams from the at least one pair of X-ray generating means are adjacent to each other, or intersect with each other, thereby detecting the plural numbers of the Debye rings caused due to the X-ray and the X&#x2032;-ray in common with.

X-ray stress measuring apparatus

A goniometer in an X-ray diffraction device comprises a sample table rotatably provided about a center axis of a sample for holding a sample, an X-ray source rotatably provided about the center axis of the sample for irrdiating first X-ray onto a sample, and an X-ray detector rotatably provided about the center axis of the sample for detecting second X-rays resulting from the irradiation of the first X-rays, the second X-rays being diffracted X-rays depending upon a sample. The sample table, the X-ray source an the X-ray detector are rotatable independently of one another, and a component to be fixed can be freely selected in accordance with a purpose of measurement and sample attachments employed. As such, various kinds of measuring methods are available to perform X-ray diffraction analysis by a single goniometer.

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Tokyo, Japan

Shigeru Munekawa