The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Jul. 29, 2011
Hideo Toraya, Tachikawa, JP;
Shigeru Munekawa, Tokyo, JP;
Hideo Toraya, Tachikawa, JP;
Shigeru Munekawa, Tokyo, JP;
RIGAKU CORPORATION, Tokyo, JP;
Abstract
An X-ray stress measuring apparatus, for measuring stress on a sample, comprises: a pair of X-ray generating means (') for irradiating X-ray beams, determining an angle defined between the X-ray beams, mutually, at an arbitrary fixed angle, on a plane inclining by an angle desired with respect to a surface of the sample to be measured stress thereon; an X-ray sensor portion () for detecting plural numbers of Debye rings (C, C′), which are generated by incident X-ray beams from said pair of X-ray generating means; and a battery () for supplying necessary electricity to each of parts of the apparatus, wherein said X-ray sensor portion is made up with only one (1) piece of a 2-dimensional X-ray detector () or a 1-dimensional X-ray detector (′), and is disposed in a position where the plural numbers of Debye rings generated by the incident X-ray beams from the at least one pair of X-ray generating means are adjacent to each other, or intersect with each other, thereby detecting the plural numbers of the Debye rings caused due to the X-ray and the X′-ray in common with.