Shigeru Miwa

Title: Shigeru Miwa: Innovator in Probe Technology

Introduction

Shigeru Miwa is a prominent inventor based in Tsuchiura, Japan, known for his significant contributions to probe technology. With a total of five patents to his name, Miwa has made remarkable advancements in the field of scanning probe microscopy.

Latest Patents

Miwa's latest patents include a probe manufacturing method, a probe, and a scanning probe microscope. The probe manufacturing method involves attaching a carbon nanotube to a mounting base end, which effectively eliminates the effects of a carbon contamination film. This innovation increases the bonding strength and conductivity of the probe while enhancing its overall performance. The entire circumference of the nanotube and the base is coated with a film, rather than just one side, ensuring better functionality. The process of mounting the carbon nanotube is conducted under microscopic observation, and any carbon contamination film formed by an electron microscope is removed prior to bonding.

Another significant patent is the scanning type probe microscope and the probe moving control method. This method allows for precise control of the probe tip movement in a scanning probe microscope equipped with a cantilever. The atomic force between the probe tip and the sample is measured as the probe scans the sample's surface. The system utilizes X-, Y-, and Z-fine movement mechanisms to adjust the positions of the probe tip and the sample, maintaining high measurement accuracy even on uneven surfaces.

Career Highlights

Throughout his career, Shigeru Miwa has worked with notable companies such as Hitachi Kenki Fine Tech Co., Ltd. and Hitachi Construction Machinery Co., Ltd. His experience in these organizations has contributed to his expertise in developing advanced probe technologies.

Collaborations

Miwa has collaborated with several talented individuals in his field, including Takenori Hiroki and Ken Murayama. Their joint efforts have further propelled innovations in probe technology.

Conclusion

Shigeru Miwa's contributions to probe technology and his innovative patents have significantly impacted the field of scanning probe microscopy. His work continues to inspire advancements in measurement accuracy and probe performance.