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For the Inventor, By the Inventor

Tokyo, Japan

Shigemitsu Aoki

This inventor holds 28 USPTO granted patents, primarily in Electromagnetic Relays. Top assignees: Fujitsu Takamisawa Component Limited, Mitutoyo Corporation, Fujitsu Component Limited. Active years: 1989-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigemitsu Aoki. Retrieved from https://idiyas.com/inventor/shigemitsu-aoki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 28

% Patents Active = 67.9

Average Co-Inventor Count = 3.1

ph-index = 7

Forward Citations = 156(Granted Patents)


Location History:

  • Saku, JP (1990 - 1993)
  • Suzaki, JP (1999)
  • Shinagawa, JP (2002 - 2012)
  • Tokyo, JP (1989 - 2024)

Company Filing History:

goldMedal7 out of 107 
 
Fujitsu Takamisawa Component Limited
 patents
silverMedal7 out of 1,678 
 
Mitutoyo Corporation
 patents
bronzeMedal5 out of 807 
 
Fujitsu Component Limited
 patents
4. 5 out of 19 
 
Takamisawa Electric Co., Ltd
 patents
5. 1 out of 1,033 
 
Kabushiki Kaisha Topcon
 patents
6. 1 out of 29,888 
 
Texas Instruments Corporation
 patents
where one patent can have more than one assignee

Years Active: 1989-2026

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Areas of Expertise:
Height Gauge
Electromagnetic Relay
Digital Display
Surface Measurement
Refractive Power
Operational Device
Magnetic Field
Keyboard Panel
Switch Mechanism
Acoustic Noise
Complex Relay
28 patents (USPTO):Explore Patents
1. D1149738 - Grip for height gauge (2026-09-29),
2. D1148562 - Knob for height gauge (2026-09-22),
3. D1148561 - Display for height gauge (2026-09-22),
4. D1148560 - Height gauge (2026-09-22),
5. D1034254 - Digital display for height gauge (2024-07-09),
6. D1026692 - Operation device with display (2024-05-14),
7. D1013539 - Height gauge (2024-02-06),
8. D1012740 - Height gauge (2024-01-30),
9. D840847 - Machine for measuring surface shape and surface roughness (2019-02-19),
10. 8279028 - Electromagnetic relay (2012-10-02),
11. D555016 - Apparatus for measuring refractive power of lens (2007-11-13),
12. 7283026 - Electromagnetic relay (2007-10-16),
13. 7106154 - Electromagnetic relay (2006-09-12),
14. 6972651 - Switch operable under a predetermined condition, external magnetic field generating unit, combination of such a switch and an external magnetic field generating unit and electronic apparatus incorporating the same (2005-12-06),
15. 6903638 - Complex electromagnetic relay (2005-06-07),

Title: The Innovations of Shigemitsu Aoki: A Legacy of Inventions

Introduction: Shigemitsu Aoki, a distinguished inventor based in Tokyo, Japan, has made significant contributions to the field of technology through his diverse range of innovations. With a remarkable portfolio of 24 patents, his work encompasses advancements that have paved the way for various industrial applications.

Latest Patents: Among his latest inventions are a digital display for height gauges and an operation device with a display. These patents reflect Aoki's commitment to enhancing precision and usability in measurement devices, showcasing his innovative approach to technology.

Career Highlights: Throughout his career, Aoki has been affiliated with prominent companies, including Fujitsu Takamisawa Component Limited and Takamisawa Electric Co., Ltd. His tenure at these firms has allowed him to develop patented technologies that demonstrate his expertise and inventive spirit.

Collaborations: Aoki's journey in innovation has also been marked by collaborations with notable coworkers such as Yoshio Okamoto and Akihiko Nakamura. Together, they have embarked on various projects that have contributed to the advancement of technology in their respective fields.

Conclusion: Shigemitsu Aoki's contributions to the world of invention exemplify the importance of creativity and innovation in technology. His collection of patents and collaboration with talented individuals underscore a legacy that continues to inspire future generations of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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