Saitama, Japan

Shigeho Noda

USPTO Granted Patents = 3 

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Location History:

  • Saitama, JP (2015 - 2022)
  • Wako, JP (2022)

Company Filing History:


Years Active: 2015-2022

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3 patents (USPTO):Explore Patents

Title: Shigeho Noda: Innovator in Tomographic Imaging and Measurement Technologies

Introduction

Shigeho Noda is a prominent inventor based in Saitama, Japan. He has made significant contributions to the fields of tomographic imaging and measurement technologies. With a total of 3 patents to his name, Noda's work has advanced the capabilities of imaging systems and measurement apparatuses.

Latest Patents

Noda's latest patents include a method and device for acquiring tomographic image data by oversampling. This innovation aims to enhance the reproducibility of reconstructed tomographic images without increasing computational load. The method involves oversampling in (N+n) directions during imaging, allowing for efficient detection by N detection elements. Additionally, he has developed a measurement apparatus that utilizes primary and secondary acceleration sensors to estimate the spin rate of flying objects, showcasing his expertise in measurement technologies.

Career Highlights

Throughout his career, Shigeho Noda has worked with notable companies such as Riken Corporation and Nissan Chemical Corporation. His experience in these organizations has contributed to his development as an inventor and has provided him with a platform to innovate in his field.

Collaborations

Noda has collaborated with talented individuals, including Ryutaro Himeno and Takuya Maeyama. These partnerships have likely fostered a creative environment that has led to the development of his innovative patents.

Conclusion

Shigeho Noda's contributions to tomographic imaging and measurement technologies highlight his role as a significant inventor in Japan. His innovative patents and collaborations reflect his commitment to advancing technology in these fields.

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