The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

May. 28, 2019
Applicants:

Riken, Wako, JP;

Nissan Chemical Corporation, Tokyo, JP;

Inventors:

Takaoki Takanashi, Wako, JP;

Shigeho Noda, Wako, JP;

Masaru Tamura, Wako, JP;

Yoshie Otake, Wako, JP;

Assignees:

RIKEN, Saitama, JP;

Nissan Chemical Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G06T 11/006 (2013.01); G01N 2223/345 (2013.01); G01N 2223/401 (2013.01);
Abstract

In order to increase reproducibility of a reconstructed tomographic image without increasing the computational load, detection is performed by oversampling in (N+n) directions during imaging for detection by N detection elements. A vector having N×(N+n) elements is obtained, and vector decimation step is performed in which a total of n×N elements corresponding to a sequence {k}denoting a decimation order are removed. In a discrete Radon transform step, a corresponding discrete Radon inverse matrix Wis operated, and in an image data generation step, de-vectoring is performed, thereby tomographic image data are acquired. When oversampling is used, a discrete Radon inverse matrix Wis obtained. Therefore, a tomographic image is obtained by matrix computation without resorting to iterative approximation.


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