This inventor holds 2 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: Shigeaki Naitoh: Innovator in Terahertz Wave Measurement Technology
Introduction
Shigeaki Naitoh is a prominent inventor based in Gunma, Japan. He has made significant contributions to the field of terahertz wave measurement technology. With a total of 2 patents, Naitoh's work focuses on innovative methods and devices that enhance measurement accuracy and efficiency.
Latest Patents
Naitoh's latest patents include a container and a container positioning method, as well as a measuring method. The container is designed to house a device under test, which is measured using a terahertz wave measurement device. It features a gap portion for the device and an enclosure that includes two flat surface portions, ensuring precise measurement conditions. The relationship between the refractive indices of the enclosure and the device is carefully defined to optimize performance. Additionally, his fixing instrument patent describes fixtures that maintain the shape of the device's end surfaces while allowing for accurate electromagnetic wave measurements.
Career Highlights
Shigeaki Naitoh is currently associated with Adv Antest Corporation, where he continues to develop cutting-edge technologies. His work has been instrumental in advancing the capabilities of terahertz wave measurement, making significant impacts in various applications.
Collaborations
Naitoh collaborates with Shigeki Nishina, contributing to the innovative projects at Adv Antest Corporation. Their combined expertise enhances the development of new technologies in the field.
Conclusion
Shigeaki Naitoh's contributions to terahertz wave measurement technology exemplify his innovative spirit and dedication to advancing scientific understanding. His patents reflect a commitment to improving measurement techniques, which can have far-reaching implications in various industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
