The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Nov. 12, 2009
Shigeki Nishina, Miyagi, JP;
Shigeaki Naitoh, Gunma, JP;
Shigeki Nishina, Miyagi, JP;
Shigeaki Naitoh, Gunma, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A container according to the present invention contains at least a part of a device under test to be measured by a terahertz wave measurement device. The container includes a gap portion that internally disposes at least a part of the device under test, and an enclosure portion that includes a first flat surface portion and a second flat surface portion, and disposes the gap portion between the first flat surface portion and the second flat surface portion, thereby enclosing the gap portion. Moreover, a relationship n1−0.1≦n2≦n1+0.1 holds where n2 is a refractive index of the enclosure portion, and n1 is a refractive index of the device under test. Further, the first flat surface portion intersects with a travel direction of the terahertz wave at the right angle.