Cairo, Egypt

Sherif Hany Mousa

This inventor holds 1 USPTO granted patent. Top assignee: Mentor Graphics Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sherif Hany Mousa. Retrieved from https://idiyas.com/inventor/sherif-hany-mousa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Sherif Hany Mousa: Circuit Layout Innovation

Introduction

Sherif Hany Mousa is an inventor associated with Cairo, Egypt, and Mentor Graphics Corporation. His patent work addresses the detection and correction of electrical hotspots in circuit layout designs, with a focus on analog circuits.

Latest Patents

Mousa is credited with 1 patent: “Electrical Hotspot Detection, Analysis and Correction.” The invention describes extracting layout parameters for device instances subject to electrical constraints and using them to calculate electrical parameter variations. This analysis can identify electrical hotspots in a circuit layout. Sensitivity analysis then generates repair hints, which guide adjustments to the layout design.

Career Highlights

Mousa’s documented patent contribution focuses on applying analysis and sensitivity techniques to improve circuit layouts. The invention connects electrical constraint data with practical repair guidance for analog circuit designs.

Collaborations

His listed coworkers include Ahmed Arafa and Abdelrahman ElMously. The patent information provided identifies Mentor Graphics Corporation as his company affiliation.

Conclusion

Sherif Hany Mousa’s patent highlights an approach to identifying and correcting electrical hotspots through layout analysis, sensitivity assessment, and targeted design adjustments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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