logo

For the Inventor, By the Inventor

Hsin-Chu, Taiwan

Sheng-Jen Wang

USPTO Granted Patents = 8

Average Co-Inventor Count = 2.6

ph-index = 4

Forward Citations = 34(Granted Patents)


Company Filing History:

goldMedal8 out of 269 
 
Powerchip Semiconductor Corporation
 patents

Years Active: 2003-2008

Loading Chart...
8 patents (USPTO):Explore Patents
1. 7412090 - Method of managing wafer defects (2008-08-12),
2. 7260444 - Real-time management systems and methods for manufacturing management and yield rate analysis integration (2007-08-21),
3. 7099729 - Semiconductor process and yield analysis integrated real-time management method (2006-08-29),
4. 7079677 - Automatic intelligent yield improving and process parameter multivariate system and the analysis method thereof (2006-07-18),
5. 6999897 - Method and related system for semiconductor equipment early warning management (2006-02-14),
6. 6950783 - Method and related system for semiconductor equipment prevention maintenance management (2005-09-27),
7. 6807454 - Method for automatically controlling defect -specification in a semiconductor manufacturing process (2004-10-19),
8. 6531776 - Semiconductor device having reduced interconnect-line parasitic capacitance (2003-03-11),

Title: Innovations of Sheng-Jen Wang

Introduction

Sheng-Jen Wang is a prominent inventor based in Hsin-Chu, Taiwan. He has made significant contributions to the field of semiconductor technology, holding a total of 8 patents. His work focuses on improving manufacturing processes and yield rates in semiconductor production.

Latest Patents

One of his latest patents is a method of managing wafer defects. This method involves inspecting each chip in a wafer to generate a unit of wafer defect raw data. A server is then used to integrate this data to create a unit of wafer defect distribution data, which records the positions, types, and sizes of defects. The server generates a corresponding drawing file to illustrate various defect distributions, allowing terminal users to view these distributions without needing the raw data.

Another notable patent is related to real-time management systems and methods for manufacturing management and yield rate analysis integration. This method sums and averages multiple yield rates related to wafer products to establish a historical yield rate. It selects multiple representational inline QC parameters and implements a statistical process to identify optimum inline QC parameters. The predicted yield rate is then calculated based on the historical yield rate, weights, and various measurement and target values.

Career Highlights

Sheng-Jen Wang is currently employed at Powerchip Semiconductor Corporation, where he continues to innovate in the semiconductor industry. His expertise in managing wafer defects and yield rates has positioned him as a key figure in his field.

Collaborations

He has collaborated with notable coworkers, including Hung-En Tai and Chien-Chung Chen, contributing to advancements in semiconductor technology.

Conclusion

Sheng-Jen Wang's innovative patents and contributions to the semiconductor industry highlight his role as a leading inventor. His work continues to influence manufacturing processes and improve yield rates in semiconductor production.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…