The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Mar. 11, 2004
Applicants:

Hung-en Tai, Taipei Hsien, TW;

Chien-chung Chen, Hsin-Chu, TW;

Haw-jyue Luo, Hsin-Chu, TW;

Sheng-jen Wang, Hsin-Chu, TW;

Inventors:

Hung-En Tai, Taipei Hsien, TW;

Chien-Chung Chen, Hsin-Chu, TW;

Haw-Jyue Luo, Hsin-Chu, TW;

Sheng-Jen Wang, Hsin-Chu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and related system for semiconductor equipment early warning management. The method includes recording process parameters of each piece of equipment, recording equipment parameters when each piece of equipment is processing, evaluating and recording the quality of semiconductor products and corresponding testing parameters, and analyzing a relationship between the corresponding process parameters, the corresponding equipment parameters, and the quality of semiconductor products of each piece of equipment.


Find Patent Forward Citations

Tai, Hung-En. (2006). Method and related system for semiconductor equipment early warning management (U.S. Patent No. 6999897). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6999897

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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