Shen-Hao Tsai

Title: Innovations of Shen-Hao Tsai

Introduction

Shen-Hao Tsai is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of electronic component inspection and protection. With a total of 2 patents, his work focuses on enhancing the accuracy and reliability of electronic testing systems.

Latest Patents

One of Shen-Hao Tsai's latest patents is a wafer inspection system. This system includes a carrier device, a probe card, a first metal kit, and a surround separating unit. The probe card features a detection portion and a conductive layer that surrounds it, which is designed to improve inspection accuracy by shielding the detection portion and wafer from external noise or interference sources. Another significant patent is a surge protection module. This module comprises a carrier board and a probe set, which includes multiple probes and a short-circuit unit. The short-circuit unit can be selectively moved to either contact all probes or isolate them, providing flexibility in testing electronic components.

Career Highlights

Shen-Hao Tsai is currently employed at Chroma Ate Inc., a company known for its advanced testing and measurement solutions. His work at Chroma Ate Inc. has allowed him to develop innovative technologies that address the challenges faced in electronic component testing.

Collaborations

Throughout his career, Shen-Hao Tsai has collaborated with talented individuals such as Chin-Yuan Chang and Chun-Hao Hu. These collaborations have contributed to the development of his patents and innovations.

Conclusion

Shen-Hao Tsai's contributions to the field of electronic testing through his patents demonstrate his commitment to innovation and excellence. His work continues to influence the industry and improve the accuracy of electronic component inspections.