This inventor holds 10 USPTO granted patents and 3 published patent applications and 1 EPO patent. Top assignees: Mitutoyo Corporation, Other. Active years: 2003-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Westminster, CA (US) (2003)
- Northfield, NJ (US) (2007)
- Bothell, WA (US) (2012 - 2013)
- Woodinville, WA (US) (2012 - 2023)
Company Filing History:
8 out of 1,677 
2 out of 834,453 Years Active: 2003-2026
Title: Innovations of Shannon Roy Campbell
Introduction
Shannon Roy Campbell is a notable inventor based in Woodinville, WA (US), recognized for his contributions to metrology and defect detection systems. With a total of 9 patents to his name, Campbell has made significant advancements in the field of optical systems and workpiece inspection.
Latest Patents
One of his latest patents is a metrology system with a projected pattern for points-from-focus type processes. This innovative system includes an objective lens portion, a light source, a pattern projection portion, and a camera. The design allows for the use of different lenses with varying magnifications and cutoff frequencies. The projected pattern on a workpiece surface enhances contrast, enabling the acquisition of an image stack from which focus curve data can be determined, indicating the three-dimensional positions of workpiece surface points.
Another significant patent involves a workpiece inspection and defect detection system. This system comprises a light source, a lens for inputting image light from a workpiece surface, and a camera for receiving the imaging light. The system utilizes images acquired by the camera as training images to train a defect detection portion, which classifies images of workpieces as anomalous based on determined features. This allows for further operations, such as metrology operations for measuring dimensions of defects.
Career Highlights
Throughout his career, Campbell has worked with various companies, including Mitutoyo Corporation. His expertise in metrology and optical systems has positioned him as a key player in the development of advanced inspection technologies.
Collaborations
Some of his notable coworkers include Robert Kamil Bryll and William Todd Watson, who have contributed to his projects and innovations.
Conclusion
Shannon Roy Campbell's work in metrology and defect detection systems showcases his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving inspection processes and enhancing the accuracy of measurements in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile