The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2003

Filed:

Feb. 21, 2001
Applicant:
Inventor:

Shannon Roy Campbell, Westminster, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 ;
U.S. Cl.
CPC ...
G06K 9/46 ;
Abstract

I present a method for matching the spatial relationships between an input set of feature points and a template set of feature points. A feature point consists of a location in space and a label describing the feature at that location in space. A tessellation over the feature point locations is performed. Next, a search identifies polyhedra that have similar contents, the contents being the angles and labels associated with feature points of the polyhedra. Once a match is found, then appropriate adjacent and neighboring polyhedra are examined. Matching the node labels and angular relationships for a set of appropriate adjacent and neighboring polyhedra extends the volume over which matches exist and significantly increases the certainty that a positive match exists. Because this matching method is based on similarities in node angles and labels, it is independent of transformations in position, rotation, and scale if the angles in the polyhedra created by the tessellation are position, rotation, and scale invariant.


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