Seung Min Baek

Title: Seung Min Baek: Memory Fault Management and Error Logging Innovations.

Introduction

Seung Min Baek is an inventor based in San Jose, California, whose work focuses on memory-device reliability and fault management. He is associated with SK hynix Inc. and is credited with 2 patents.

Latest Patents

Baek’s listed patents address ways to detect, record, and manage faults in memory devices.

“Controller Including Fault Management Device with Mapping Control Circuit and Fault Management Method” describes a fault-management device that stores fault addresses and corresponding repair addresses. Its mapping control circuit can mask selected address bits based on mode information, supporting repair management when faults affect multiple sub-word lines.

“Memory Device Including Error Logging Device and Operating Methods Thereof” describes a memory device that detects faults during error-check operations and manages the resulting fault addresses. The system identifies a start fault address, compares it with other fault addresses, and generates fault-mode information for error reporting.

Career Highlights

The patents highlight Baek’s contributions to memory fault detection, address mapping, repair operations, and error logging. These techniques are directed toward organizing fault information and supporting the management of memory-device errors.

Collaborations

Baek’s listed coworkers include Eui Sang Oh and Hoiju Chung. His work is associated with SK hynix Inc.

Conclusion

Seung Min Baek’s patent work centers on practical approaches to identifying, recording, and managing memory faults, contributing to the reliability and repairability of memory devices.