The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Dec. 10, 2024
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventors:

Eui Sang Oh, San Jose, CA (US);

Hoiju Chung, San Jose, CA (US);

Yong Jun Lee, San Jose, CA (US);

Seung Min Baek, San Jose, CA (US);

Woong Ju Jang, San Jose, CA (US);

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/18 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/18 (2013.01); G11C 29/44 (2013.01);
Abstract

A memory device includes a memory cell array including memory cells coupled to a plurality of rows that are subject to error check operations. A fault detection circuit generates a fault address for each of the plurality of rows according to a result of an error check operation and outputs the fault addresses together with a fault input signal to a fault information management circuit. The fault information management circuit uses the fault addresses to generate and store first to third fault addresses, where the first fault address is a start fault address. The start fault address and the second and third fault addresses are compared and used to generate fault mode information that defines a relationship between the stored start fault address and the second and third fault addresses, according to the fault input signal. The fault information management circuit outputs error information including the start fault address and the fault mode information.


Find Patent Forward Citations

Oh, Eui. (2026). Memory device including error logging device and operating methods thereof (U.S. Patent No. 12755805). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12755805

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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