This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Consiglio Nazionale Delle Ricerche. Active years: 2006-2007.
Location History:
- Naples, IT (2006)
- Arco Felice, IT (2007)
Company Filing History:
Years Active: 2006-2007
Title: The Innovative Contributions of Sergio De Nicola
Introduction
Sergio De Nicola is a prominent inventor based in Arco Felice, Italy. He has made significant contributions to the field of holography and interferometry, holding a total of 2 patents. His work focuses on advanced methods for imaging and measurement, showcasing his expertise and innovative spirit.
Latest Patents
Sergio De Nicola's latest patents include a holographic method with numerical reconstruction for obtaining an image of a three-dimensional object. This method ensures that even points out of the depth of field are in focus. The process involves extracting a phase image from a digitalized hologram, selecting a subassembly of distance values, and reconstructing a three-dimensional intensity image of the object.
Another notable patent is an interferometric system designed for the simultaneous measurement of the index of refraction and the thickness of transparent materials. This system utilizes a shear interferometer and allows for the determination of both parameters in a single measurement operation. The innovative approach enhances the accuracy and efficiency of optical measurements.
Career Highlights
Sergio De Nicola is affiliated with the Consiglio Nazionale Delle Ricerche, where he continues to advance research in his field. His work has garnered attention for its practical applications and contributions to scientific knowledge.
Collaborations
Throughout his career, Sergio has collaborated with esteemed colleagues such as Giuseppe Coppola and Pietro Ferraro. These partnerships have further enriched his research and innovation efforts.
Conclusion
Sergio De Nicola's contributions to holography and interferometry exemplify the spirit of innovation in modern science. His patents reflect a commitment to advancing technology and improving measurement techniques. His work continues to inspire future developments in these fields.