Consiglio Nazionale Delle Ricerche

Sergio De Nicola

Pietro Ferraro

Paolo De Natale

Gianluca Gagliardi

Giuseppe Coppola

Andrea Finizio

Simonetta Grilli

Bahram Javidi

Giovanni Pierattini

Mario Iodice

A holographic method with numerical reconstruction for obtaining an image of a three-dimensional object, employs a digitalized hologram of an object or of a portion thereof, and includes starting from the digitalized hologram, extracting a phase image of the object corresponding to a matrix MD of distance values, selecting a subassembly SD of the distance value assembly present in matrix MD, subassembly SD containing distance values d, extracting from matrix MD an iso-level assembly IQdof corresponding bidimensional coordinate of the object; reconstructing, for each distance value d, a bidimensional matrix IMdof intensity values relevant to the object; extracting, from each bidimensional matrix IMd, a bidimensional IFdof intensity values; and starting from the intensity values, reconstructing the three-dimensional intensity image of the object.

Holographic method with numerical reconstruction for obtaining an image of a three-dimensional object in which even points out of the depth of field are in focus, and holographic apparatus using such a method

Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials with a single measurement operation. The system employs an interferometer as a 'shear interferometer' with the advantage of varying the wavelength of the luminous source. The index of refraction and the thickness are determined in two phases. Firstly it is determined the optical path analyzing the displacement of interferometric signal obtained by orthogonal incidence; successively, by means of phase recovery techniques and the previously determined optical path value, it is possible to obtain the index of refraction of the material. From the knowledge of the index and of the optical path it is obtained the material thickness.

Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure

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Arco Felice, Italy

Sergio De Nicola