Seong-Keun Cho

Title: Seong-Keun Cho: Innovator in Semiconductor Testing Technologies

Introduction

Seong-Keun Cho is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor testing, holding a total of 2 patents. His work focuses on innovative methods for detecting defects in substrates and improving testing processes.

Latest Patents

Cho's latest patents include a "Method of testing an interconnection substrate and apparatus for performing the same." This method involves setting a blocking condition for reference light reflected from a probe with intrinsic optical characteristics. The electric field emitted from a test interconnection substrate alters the probe's characteristics, allowing for the detection of abnormal circuits through remaining reflected light. Another notable patent is the "Method of detecting a defect on a substrate, apparatus for performing the same and method of manufacturing semiconductor device using the same." This method utilizes an incident beam to generate reflected light beams, detecting a second harmonic generation (SHG) beam that indicates defects on the substrate, including nano-sized defects.

Career Highlights

Seong-Keun Cho is currently employed at Samsung Electronics Co., Ltd., where he continues to advance semiconductor technologies. His expertise in optical characteristics and defect detection has positioned him as a key player in the industry.

Collaborations

Throughout his career, Cho has collaborated with notable colleagues, including Won-Don Joo and Sang-Min Lee. These partnerships have fostered innovation and contributed to the development of cutting-edge technologies in semiconductor testing.

Conclusion

Seong-Keun Cho's contributions to semiconductor testing through his innovative patents and collaborations highlight his importance in the field. His work continues to influence advancements in technology and improve the reliability of semiconductor devices.