This inventor holds 3 USPTO granted patents. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2014-2015.
Company Filing History:
Years Active: 2014-2015
Title: Seock Woo Jang: Innovator in Particle Measurement Technology
Introduction
Seock Woo Jang is a prominent inventor based in Suwon, South Korea. He has made significant contributions to the field of particle measurement technology, holding a total of 3 patents. His work focuses on developing advanced apparatuses that enhance the accuracy and efficiency of particle analysis.
Latest Patents
One of his latest patents is a particle measuring apparatus and measuring method using the same. This invention provides a particle measurement apparatus that features a plurality of apertures arranged in series. It also includes a method to statistically analyze multiple signals generated when a particle passes through these apertures, allowing for more accurate information on particles. The apparatus consists of several aperture members, electrodes to form an electric field, and an analyzer for statistical analysis of the electrical signals generated during the measurement process.
Another notable patent is a sample analysis apparatus designed to automatically press a start button upon the installation of a sample tube. This apparatus includes a body, a door housing that can be opened or closed, and a tube accommodating unit for the sample tube. The design ensures that the analysis starts only when the sample tube is properly installed and the door is closed, enhancing the reliability of the analysis process.
Career Highlights
Seock Woo Jang is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate and develop new technologies. His work at Samsung has positioned him as a key player in the advancement of measurement technologies.
Collaborations
He collaborates with talented coworkers, including Tae Soo Kim and Chul Ho Yun, who contribute to the innovative environment at Samsung Electronics.
Conclusion
Seock Woo Jang's contributions to particle measurement technology exemplify his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in particle analysis, making significant strides in the field.