The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Dec. 27, 2011
Yong Koo Lee, Yongin-Si, KR;
IN Duk Hwang, Inchun, KR;
Tae Soo Kim, Yongin-si, KR;
Jong Gun Lee, Suwon-si, KR;
Seock Woo Jang, Suwon-si, KR;
Chul Ho Yun, Suwon-si, KR;
Yong Koo Lee, Yongin-Si, KR;
In Duk Hwang, Inchun, KR;
Tae Soo Kim, Yongin-si, KR;
Jong Gun Lee, Suwon-si, KR;
Seock Woo Jang, Suwon-si, KR;
Chul Ho Yun, Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-Si, KR;
Abstract
Provided are a particle measurement apparatus having a plurality of apertures arranged in series therein, and a particle measurement method using the same to statistically analyze multiple signals generated when a particle passes through the plurality of apertures, thus acquiring more accurate information on particles. The particle measurement apparatus includes a plurality of aperture members arranged in series, a plurality of electrodes to form an electric field within the plurality of aperture members, and an analyzer for statistically analyzing multiple electrical signals generated when a particle passes through the plurality of aperture members.