Samsung Electronics Co., Ltd.

Seock Woo Jang

In Duk Hwang

Tae Soo Kim

Chul Ho Yun

Yong Koo Lee

Jong Gun Lee

Seok Ho Kim

Jong Rip Lee

Sung Hwa Lee

Provided are a particle measurement apparatus having a plurality of apertures arranged in series therein, and a particle measurement method using the same to statistically analyze multiple signals generated when a particle passes through the plurality of apertures, thus acquiring more accurate information on particles. The particle measurement apparatus includes a plurality of aperture members arranged in series, a plurality of electrodes to form an electric field within the plurality of aperture members, and an analyzer for statistically analyzing multiple electrical signals generated when a particle passes through the plurality of aperture members.

Particle measuring apparatus and measuring method using the same

A sample analysis apparatus configured to automatically press a start button upon installation of a sample tube is provided. The sample analysis apparatus includes: a body of the sample analysis apparatus; a door housing which may be provided in an opened state or a closed state, and configured to be coupled to the body of the sample analysis apparatus by a hinge; a tube accommodating unit included in the door housing and configured to accommodate the sample tube; a start button included in the body of the sample analysis apparatus and configured to start analysis of the sample; and an operating member positioned at a first position which is distant from the start button the sample tube is not installed in the tube accommodating unit, and a second position which is configured to operate the start button when a sample tube is installed and the door housing is closed.

Sample analysis apparatus

Assigning identifiers to a plurality of test devices to manage the test devices, and displaying the assigned identifiers on the test devices to distinguish the test devices.

Management system of test device and management method thereof

Growing community of inventors

Suwon-si, South Korea

Seock Woo Jang