Seiji Otani

Title: Seiji Otani: Innovator in Defect Inspection Technology

Introduction

Seiji Otani is a prominent inventor based in Kamisato, Japan, known for his significant contributions to defect inspection technology. With a total of nine patents to his name, Otani has developed innovative methods and apparatuses that enhance the efficiency and accuracy of defect detection in various applications.

Latest Patents

One of Otani's latest patents is an inspection apparatus and method designed for defect inspection. This apparatus emits light to a test object and detects reflected or scattered light to identify defects. It features a temperature-controlled part accommodating section that maintains the necessary temperature for various components within the apparatus. A first temperature measuring instrument monitors the temperature, while a temperature control unit ensures that the interior of the section remains at a prescribed temperature, allowing for efficient temperature control without increasing the size of the apparatus.

Another notable patent is a method and apparatus for detecting particles on a specimen. This invention illuminates the surface of a specimen with an elongated light flux from multiple directions, which differ in elevation angle. By switching the optical path of the light flux based on the type of defect being detected, the apparatus captures multiple optical images using various image sensors. The images are processed to detect defects on the specimen, showcasing Otani's innovative approach to defect inspection.

Career Highlights

Seiji Otani has worked with notable companies, including Hitachi High-Technologies Corporation. His experience in these organizations has contributed to his expertise in developing advanced inspection technologies.

Collaborations

Throughout his career, Otani has collaborated with talented individuals such as Akira Hamamatsu and Minori Noguchi. These collaborations have likely played a role in enhancing his innovative capabilities and expanding his contributions to the field.

Conclusion

Seiji Otani's work in defect inspection technology exemplifies his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in defect detection and provide effective solutions that benefit various industries.