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For the Inventor, By the Inventor

Yokohama, Japan

Seii Miyakawa

USPTO Granted Patents = 18

Average Co-Inventor Count = 4.6

ph-index = 10

Forward Citations = 213(Granted Patents)


Location History:

  • Yokohama, JA (1978)
  • Yokohama, JP (1979 - 2005)

Company Filing History:

goldMedal18 out of 42,485 
 
Hitachi, Ltd.
 patents

Years Active: 1978-2005

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18 patents (USPTO):Explore Patents
1. 6895350 - Fraction defective estimating method, system for carrying out the same recording medium (2005-05-17),
2. 6625511 - Evaluation method and its apparatus of work shop and product quality (2003-09-23),
3. 6553273 - Fraction defective estimating method, system for carrying out the same and recording medium (2003-04-22),
4. 6526326 - Fraction defective estimating method and system for estimating an assembly fraction defective of an article (2003-02-25),
5. 6401000 - Fraction defective estimating method and system for estimating an assembly fraction defective of an article (2002-06-04),
6. 6223092 - Automatic manufacturing evaluation method and system (2001-04-24),
7. 6108586 - Fraction defective estimating method, system for carrying out the same (2000-08-22),
8. 5717598 - Automatic manufacturability evaluation method and system (1998-02-10),
9. 4595335 - Pick and place unit (1986-06-17),
10. 4489993 - CRT mounting structure (1984-12-25),
11. 4441133 - Tape guide of magnetic recording and reproducing apparatus (1984-04-03),
12. 4379517 - Magnetic tape running system (1983-04-12),
13. 4345282 - Apparatus for bringing wire-shaped or tape-shaped carrier into contact (1982-08-17),
14. 4258399 - Magnetic recording and reproducing apparatus (1981-03-24),
15. 4209898 - Assembly line for parts of electronic and other equipments (1980-07-01),

Title: Seii Miyakawa: Innovator in Manufacturing Quality Assessment

Introduction

Seii Miyakawa is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of manufacturing quality assessment, holding a total of 18 patents. His work focuses on improving the accuracy of defect estimation in manufacturing processes.

Latest Patents

Miyakawa's latest patents include a "Fraction Defective Estimating Method" and a "System for Carrying Out the Same Recording Medium." This method allows for the estimation of an assembling-related fraction defective coefficient of an article at the design stage. By inputting data related to assembling operations, properties of parts, and conditions of the assembling shop, the estimated value of the fraction defective can be determined with high accuracy. Another notable patent is the "Evaluation Method and Its Apparatus of Workshop and Product Quality." This invention involves creating a workshop evaluating database to assess the quality of products and estimate failure occurrence likelihood in manufacturing workshops.

Career Highlights

Seii Miyakawa is currently employed at Hitachi, Ltd., where he continues to innovate in the field of manufacturing. His work has been instrumental in enhancing the quality control processes within the company.

Collaborations

Miyakawa has collaborated with notable coworkers such as Toshijiro Ohashi and Tatsuya Suzuki, contributing to various projects that aim to improve manufacturing efficiency and product quality.

Conclusion

Seii Miyakawa's contributions to the field of manufacturing quality assessment through his innovative patents have made a significant impact. His work continues to influence the industry, ensuring higher standards in manufacturing processes.

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