The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Mar. 16, 2000
Tatsuya Suzuki, Yokohama, JP;
Toshijiro Ohashi, Chigasaki, JP;
Seii Miyakawa, Yokohama, JP;
Masaaki Asano, Naka, JP;
Takashi Kubota, Kawasaki, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Method and apparatus for evaluating quality of a product, and a recording medium therefor. The invention includes creating and storing in advance a workshop evaluating database, extracting from the prepared workshop evaluating database those failure occurrence ratio indexes which correspond to workshop facility levels of an input manufacturing workshop for workshop-conditioned failure influential items thereof, respectively, and evaluating/estimating failure occurrence likelihood for standard manufacturing works in the manufacturing workshop, the failure occurrence likelihood being then stored as workshop index in a product evaluating database, and evaluating/estimating a quality indicating a work-related defective ratio for the products to be manufactured through a plurality of manufacturing works in the manufacturing workshop by using the workshop indexes concerning that manufacturing workshop which has been stored in the article evaluating database in the workshop evaluating step.