Phoenix, AZ, United States of America

Scot Goerutiz

This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2008.


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Scot Goerutiz: Innovator in Wafer Polishing Control

Introduction

Scot Goerutiz is a notable inventor based in Phoenix, AZ, who has made significant contributions to the field of semiconductor manufacturing. His innovative work focuses on methods for controlling the polishing of wafers, which is a critical process in the production of integrated circuits.

Latest Patents

Scot Goerutiz holds 1 patent for his invention titled "Wafer Polishing Control." This patent discloses methods for controlling the polishing of wafers by measuring pre-polish thicknesses of one or more layers. The process involves polishing these layers and subsequently measuring the post-polish thickness. The polishing is controlled using both feed-forward and feedback mechanisms, ensuring precision in the manufacturing process. Additionally, the patent includes machine-accessible software designed to implement these methods effectively.

Career Highlights

Scot Goerutiz is currently employed at Intel Corporation, a leading company in the semiconductor industry. His role involves applying his expertise in wafer polishing techniques to enhance manufacturing efficiency and product quality. His contributions are vital to the ongoing advancements in semiconductor technology.

Collaborations

Scot has collaborated with talented coworkers, including Anju Narendra and Kimberly A Ryglelski, who share his commitment to innovation in the semiconductor field.

Conclusion

Scot Goerutiz exemplifies the spirit of innovation in the semiconductor industry through his patent on wafer polishing control. His work not only advances technology but also contributes to the efficiency of semiconductor manufacturing processes.

Profile summary based on public USPTO records.
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