This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Applied Materials, Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations by Satwik Swarup Mishra
Introduction
Satwik Swarup Mishra is an accomplished inventor based in Bengaluru, India. He has made significant contributions to the field of technology, particularly in the area of defect detection in processed wafers. His innovative approach combines machine learning with practical applications in the semiconductor industry.
Latest Patents
Satwik holds a patent for a method and apparatus for training a learning model for automatic defect detection and classification of processed wafers. This patent, titled "Defect classification of processed wafers," outlines a comprehensive method that includes receiving labeled images with defect classification types and features for portions of a post-processed wafer. The process involves creating a first training set from these images and training a machine learning model to classify wafer portions based on detected defects. Additionally, it incorporates labeled wafer profiles with downstream yield data to create a second training set, enabling the model to determine the respective downstream yield of a wafer based on its profile. This innovative model can be applied to unlabeled wafer images to classify defects effectively.
Career Highlights
Satwik is currently employed at Applied Materials, Inc., where he continues to develop cutting-edge technologies in the semiconductor sector. His work focuses on enhancing the efficiency and accuracy of defect detection processes, which are crucial for maintaining high-quality standards in wafer production.
Collaborations
Some of Satwik's notable coworkers include Rahul Reddy Komatireddi and Rohith Cherikkallil. Their collaborative efforts contribute to the advancement of technology within their organization.
Conclusion
Satwik Swarup Mishra's innovative contributions to the field of defect detection in processed wafers highlight his expertise and commitment to advancing technology. His work not only enhances the efficiency of semiconductor manufacturing but also sets a benchmark for future innovations in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
