This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Honda Motor Co., Ltd.. Active years: 2014-2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014-2015
Title: Satoshi Oikawa: Patents in Bore and Hole Inspection
Introduction
Satoshi Oikawa is an inventor associated with Tochigi, Japan, and Honda Motor Co., Ltd. His work includes inspection technologies designed to assess the condition of holes and bored surfaces. He is credited with 3 patents.
Latest Patents
Oikawa’s listed recent patents include “Hole Inspection Method and Hole Inspection Device” and “Surface Inspection Device and Surface Inspection Method.”
“Hole Inspection Method and Hole Inspection Device” describes inspecting a hole’s wall using images captured through a wide-angle lens at the end of an insert shaft. As the shaft enters the hole, a gas injection mechanism directs gas toward its innermost recess. A guide surrounding the shaft’s tip forms a passage for delivering the gas along the shaft.
“Surface Inspection Device and Surface Inspection Method” concerns evaluating the inner surface of a bored hole from digital images. The device extracts lines in a set direction from images captured before and after the image is rotated by predetermined angles. It then uses the extracted lines to estimate the condition of the bore’s inner surface.
Career Highlights
Oikawa’s listed patent work focuses on image-based inspection and methods for examining internal surfaces that may be difficult to assess directly. The described inventions combine imaging, image processing, and, in the hole-inspection system, gas delivery.
Collaborations
Oikawa is associated with Honda Motor Co., Ltd. His listed coworkers include Michiaki Ohkubo and Satoshi Nojo.
Conclusion
Satoshi Oikawa’s patent portfolio highlights inspection technologies for holes and bored surfaces, with an emphasis on imaging and practical methods for evaluating internal conditions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
