Ibaraki, Japan

Satoshi Deishi



Average Co-Inventor Count = 2.1

ph-index = 6

Forward Citations = 75(Granted Patents)


Location History:

  • Osaka, JP (2007)
  • Hino, JP (2008)
  • Ibaraki, JP (1998 - 2021)

Company Filing History:


Years Active: 1998-2021

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26 patents (USPTO):Explore Patents

Title: Satoshi Deishi: Innovator in Optical Measurement Technologies

Introduction

Satoshi Deishi is a prominent inventor based in Ibaraki, Japan, known for his significant contributions to the field of optical measurement technologies. With an impressive portfolio of 26 patents, Deishi has made considerable advancements that facilitate improved diagnosis and efficiency in optical characteristic measurement devices.

Latest Patents

Among Deishi's latest innovations are two notable patents: a Diagnosis Assistance Device for Optical Characteristic Measurement Device and a Diagnosis Assistance Method for Optical Characteristic Measurement Device. The diagnosis assistance device plays a crucial role in diagnosing optical characteristic measurement devices relying on stored setting content. This invention encompasses a first and second storage unit, a processing unit, and commands designed to streamline the diagnosis process and enhance accuracy.

Deishi has also developed a sophisticated Measurement System and Communication Processing Method within that system, which involves a network of devices that communicate measurement data and calculated values related to the characteristics of objects. This system includes an acquisition unit to collect data, a storage unit, and a calculation unit designed to derive insights from the measurements and facilitate transparent communication between connected devices.

Career Highlights

Throughout his career, Satoshi Deishi has been associated with notable companies in the imaging and measurement technologies sector, including Minolta Company, Ltd. and Konica-Minolta Holdings, Inc. His innovative approaches while working at these organizations have significantly influenced the reliability and effectiveness of optical measurement devices.

Collaborations

Deishi has collaborated with distinguished colleagues including Hiroshi Goto and Tomoo Izumi. Their combined expertise in the field has further propelled advancements in optical diagnostics and measurement technologies, leading to innovative solutions that meet the needs of a rapidly evolving industry.

Conclusion

Satoshi Deishi exemplifies the spirit of innovation with his extensive portfolio and collaborative efforts in advancing optical measurement technologies. His inventions not only enhance diagnostic capabilities but also represent the forefront of advancements in the realm of optical characteristics. As he continues to contribute to this field, Deishi's work will undoubtedly pave the way for future innovations.

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