The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2012

Filed:

Mar. 28, 2008
Applicants:

Kazuo Matoba, Akashi, JP;

Tomoyuki Okamoto, Suita, JP;

Tomo Tsuboi, Itami, JP;

Yoshinori Sugahara, Kyoto, JP;

Satoshi Deishi, Ibaraki, JP;

Kagumi Moriwaki, Kawanishi, JP;

Inventors:

Kazuo Matoba, Akashi, JP;

Tomoyuki Okamoto, Suita, JP;

Tomo Tsuboi, Itami, JP;

Yoshinori Sugahara, Kyoto, JP;

Satoshi Deishi, Ibaraki, JP;

Kagumi Moriwaki, Kawanishi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 3/12 (2006.01); G06K 1/00 (2006.01); G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing apparatus comprising: a test data generator that generates test data instead of actual data entered for executing a workflow consisting of a plurality of unit works, if an instruction is given to test the workflow; a test process executor that executes a test process by processing the generated test data according to parameters for executing the unit works; a test process suspender that suspends the test process if a trouble happens during the test process; a notifier that notifies a user of a trouble if it happens during the test process; a parameter modifier that is capable of modifying the parameters if the test process is suspended due to the trouble; and a test process resuming portion that resumes the test process after the parameters are modified.


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