The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Apr. 19, 2018
Applicant:

Konica Minolta, Inc., Chiyoda-ku, JP;

Inventors:

Hironori Chono, Sakai, JP;

Yuzuru Yamamoto, Osakasayama, JP;

Satoshi Deishi, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/50 (2006.01); G01J 3/02 (2006.01); G01J 3/46 (2006.01); G06F 21/64 (2013.01);
U.S. Cl.
CPC ...
G01J 3/50 (2013.01); G01J 3/0264 (2013.01); G01J 3/0272 (2013.01); G01J 3/463 (2013.01); G06F 21/64 (2013.01);
Abstract

Measurement system includes a first device communicably connected to a second device. The first device includes an acquisition unit, a storage unit, and a first calculation unit. The acquisition unit acquires measurement data relating to a physical quantity of a characteristic of an object. The storage unit stores the measurement data. The first calculation unit calculates, from the measurement data, a first value relating to a specific index for the characteristic of the object. The first device transmits the measurement data and data indicating the first value to the second device. The second device includes a second calculation unit, and a comparison unit. The second device receives the measurement data and the first value transmitted from the first device, and calculates a second value relating to the specific index from the measurement data. The comparison unit compares the first value with the second value.


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