The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Oct. 02, 2017
Konica Minolta, Inc., Chiyoda, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
A diagnosis assistance device assists a diagnosis of an optical characteristic measurement device which operates on the basis of the content of setting stored in a setting storage unit of an optical characteristic measurement device, and includes a first storage unit, a second storage unit, a processing unit, a first command unit, a diagnosis unit, and a second command unit. The first storage unit stores in advance first setting information which indicates the content of setting at the time of diagnosis. The processing unit performs processing of acquiring, from the setting storage unit, second setting information which is stored in advance in the setting storage unit and indicates the content of setting at the time of use, and storing the acquired second setting information in the second storage unit. The first command unit issues a command to store the first setting information stored in the first storage unit in the setting storage unit. The diagnosis unit acquires a measurement result indicating a value measured by the optical characteristic measurement device which operates on the basis of the content of setting indicating the first setting information stored in the setting storage unit. The second command unit issues a command to store the second setting information stored in the second storage unit in the setting storage unit after the measurement result is acquired.