Hyogo, Japan

Satoshi Abe

This inventor holds 1 USPTO granted patent. Top assignee: Japan Electronic Materials Corporation. Active years: 2026.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Satoshi Abe: Innovator in Probe-Card Technology

Introduction

Satoshi Abe is a notable inventor based in Hyogo, Japan. He has made significant contributions to the field of electronic materials, particularly in the development of probe-card technology. His innovative work has led to the creation of a unique multilayer wiring substrate that enhances the performance of probe cards.

Latest Patents

Satoshi Abe holds a patent for a "Probe-card multilayer wiring substrate and probe card." The objective of this invention is to provide a multilayer wiring substrate for probe cards that prevents the deterioration of thin film resistors. The multilayer wiring substrate, referred to as an ST substrate, features a base insulating film on its top surface. It includes a thin film resistor connected to a pair of electrodes, an embedded heat sink with high thermal conductivity, and a cover insulating film that protects the thin film resistor.

Career Highlights

Satoshi Abe is currently employed at Japan Electronic Materials Corporation, where he continues to innovate in the field of electronic materials. His work has been instrumental in advancing the technology used in probe cards, which are essential for testing semiconductor devices.

Collaborations

Satoshi has collaborated with several talented individuals in his field, including Yusuke Harada and Shinya Hori. Their combined expertise has contributed to the successful development of advanced electronic materials.

Conclusion

Satoshi Abe's contributions to probe-card technology exemplify the importance of innovation in the electronics industry. His patent for a multilayer wiring substrate demonstrates his commitment to enhancing the performance and reliability of electronic testing equipment.

Profile summary based on public USPTO records.
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