Kawasaki, Japan

Satoru Yoshikawa


Average Co-Inventor Count = 1.4

ph-index = 5

Forward Citations = 400(Granted Patents)


Company Filing History:


Years Active: 1998-2012

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6 patents (USPTO):Explore Patents

Title: Satoru Yoshikawa: Innovator in LSI Testing Technology

Introduction

Satoru Yoshikawa is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of semiconductor technology, particularly in LSI (Large Scale Integration) testing. With a total of 6 patents to his name, Yoshikawa has developed innovative solutions that enhance the efficiency and accuracy of semiconductor testing processes.

Latest Patents

Yoshikawa's latest patents include a range of advanced technologies. One notable invention is an LSI test apparatus that features a test circuit synthesizing unit, a test pattern generating unit, a simulating unit, and a power source analyzing unit. This apparatus is designed to synthesize a test circuit and generate test patterns that activate selected gated clock buffers, thereby improving the testing process for integrated circuits. Another significant patent is related to a semiconductor integrated circuit timing analysis apparatus. This invention calculates OCV coefficients to perform accurate timing analysis, taking into account variations in delay across gate stages, which is crucial for ensuring the reliability of semiconductor chips.

Career Highlights

Throughout his career, Satoru Yoshikawa has worked with notable companies such as Fujitsu Corporation and Fujitsu Semiconductor Limited. His experience in these organizations has allowed him to refine his expertise in semiconductor technology and contribute to groundbreaking innovations in the field.

Collaborations

Yoshikawa has collaborated with esteemed colleagues, including Tetsu Tanizawa and Yasuo Kamiya. These partnerships have fostered a collaborative environment that has led to the development of advanced technologies in LSI testing.

Conclusion

Satoru Yoshikawa's contributions to the field of semiconductor technology through his innovative patents and collaborations highlight his role as a key figure in advancing LSI testing methods. His work continues to influence the industry and pave the way for future innovations.

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