The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2000

Filed:

Jun. 18, 1997
Applicant:
Inventor:

Satoru Yoshikawa, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36446828 ; 708190 ;
Abstract

A method of manufacturing an integration circuit device that includes generating logic library data with respect to a macro that includes a predetermined macro core and boundary cells positioned near input and output terminals of the macro. The logic library data includes delay characteristic data of the boundary cells given as attribute data to the input and output terminals. A logic circuit, that includes a plurality of cells and the macro, is designed, with the cells being connected to the macro core through the boundary cells connected to the input and output terminals. A delay time of the macro is calculated based on the delay characteristic data with respect to the designed logic circuit. A logic simulation on the designed logic circuit is effected based on the calculated delay time.


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