The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2001
Filed:
Mar. 18, 1998
Yasuo Kamiya, Kawasaki, JP;
Satoru Yoshikawa, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A method conducts logic simulation in an integrated circuit device, in which a macro containing logic circuits formed therein is included in a chip including a plurality of cells. The method determines a first delay parameter relating to an input terminal of an internal cell of the macro connected to the input terminal of the macro, and a second delay parameter relating to an output terminal of an internal cell of the macro connected to the output terminal of the macro. The method then determines delay time data for a whole logic circuit including the plurality of cells and the macro, in accordance with delay parameters determined for the macro, in which the first delay parameter is taken as an input terminal delay parameter and the second delay parameter is taken as an output terminal delay parameter; delay parameters determined for the plurality of cells; and connection data for the whole logic circuit. The method merges the determined delay time data for the whole logic circuit and internal delay time data for the macro so as to conduct a logic simulation for the whole logic circuit in accordance with the merged delay time data.