Company Filing History:
Years Active: 2006-2009
Title: The Innovations of Sang Hyeon Baeg
Introduction
Sang Hyeon Baeg is a notable inventor based in Cupertino, CA. He has made significant contributions to the field of technology, particularly in the area of boundary scan testing systems. With a total of 5 patents, his work has advanced the capabilities of testing interconnections between devices.
Latest Patents
One of his latest patents is focused on a test buffer design and interface mechanism for differential receiver AC/DC boundary scan testing. This boundary scan test system includes both a transmitter and a receiver, enabling DC and AC boundary scan testing of interconnections. The system effectively addresses fault masking that can occur during testing, particularly in AC coupled interconnections, while ensuring IEEE 1149.1 DC test compatibility. The test receiver features an input test buffer with built-in null detection capability and an interface mechanism that includes a technology mapper, detectors, and an integrator. This innovation provides at least partial coverage for various fault syndromes resulting from single defect conditions.
Another significant patent involves an AC boundary scan cell. This design includes multiple multiplexers, data shift registers, an XOR logic gate, and various signal input lines. Each line is connected to receive corresponding signals from the boundary scan logic, enhancing the testing capabilities of AC coupled lines.
Career Highlights
Sang Hyeon Baeg is currently employed at Cisco Technology, Inc., where he continues to innovate and develop advanced testing solutions. His work has been instrumental in improving the reliability and efficiency of electronic device testing.
Collaborations
Throughout his career, Baeg has collaborated with talented individuals such as Sung Soo Chung and Hongshin Jun. These partnerships have contributed to the successful development of his patented technologies.
Conclusion
Sang Hyeon Baeg's contributions to the field of technology through his innovative patents have significantly advanced boundary scan testing systems. His work continues to influence the industry and improve testing methodologies.