Sandeep Kumar Goel

Title: Sandeep Kumar Goel: Innovator in Voltage Management and Delay Defect Coverage

Introduction

Sandeep Kumar Goel is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of integrated circuits, particularly in voltage management and defect coverage evaluation. With a total of 4 patents to his name, Goel continues to push the boundaries of innovation in his area of expertise.

Latest Patents

One of his latest patents is titled "System and device for reducing instantaneous voltage droop during a scan shift operation." This invention addresses the challenge of voltage droop during scan shift operations by utilizing a system that includes clock gating cells and flip-flops designed to manage input clock signals effectively. Another significant patent is "Method and an apparatus for evaluating small delay defect coverage of a test pattern set on an IC." This method evaluates the small delay defect coverage (SDDC) of test patterns by analyzing transition faults and calculating detection probabilities, thereby enhancing the reliability of integrated circuits.

Career Highlights

Sandeep Kumar Goel is currently employed at LSI Corporation, where he applies his expertise in integrated circuit design and testing. His work has been instrumental in developing innovative solutions that improve the performance and reliability of electronic devices.

Collaborations

Throughout his career, Goel has collaborated with notable colleagues, including Narendra B Devta-Prasanna and Narendra Devta-Prasanna. These collaborations have fostered a creative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Sandeep Kumar Goel's contributions to the field of integrated circuits through his patents and collaborative efforts highlight his role as an influential inventor. His work continues to impact the industry positively, paving the way for future innovations.