The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Dec. 16, 2008
Sandeep Kumar Goel, Milpitas, CA (US);
Narendra B. Devta-prasanna, Milpitas, CA (US);
Ritesh P. Turakhia, Portland, OR (US);
Sandeep Kumar Goel, Milpitas, CA (US);
Narendra B. Devta-Prasanna, Milpitas, CA (US);
Ritesh P. Turakhia, Portland, OR (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A method for generating a test pattern set for detecting small delay defects of an IC is disclosed. In one embodiment, the method includes: (1) generating a traditional delay fault pattern, (2) fault grading the traditional delay fault pattern for small delay defect coverage, (3) reporting faults detected by the fault grading and delay information associated with the detected faults, (4) determining which of the detected faults are timing-aware target faults employing the delay information and (5) generating timing-aware delay fault patterns for the timing-aware target faults.