This inventor holds 1 USPTO granted patent. Top assignee: Asm Assembly Automation Limited. Active years: 2005.
Company Filing History:
Years Active: 2005
Title: The Innovative Contributions of Sai Kit Jonathan Wong
Introduction
Sai Kit Jonathan Wong is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of electrical testing through his innovative designs. With a focus on enhancing the efficiency and effectiveness of semiconductor testing, Wong has secured a patent for his groundbreaking invention.
Latest Patents
Wong's most recent patent is a "Spring contact probe device for electrical testing." This invention provides a unitary spring contact probe that comprises a resilient spring section and a plunger section extending from the distal end of the resilient spring section. The plunger section is designed to contact a semiconductor device under test, while a stopper projects from the plunger section substantially transversely to its axial direction. Additionally, the invention includes an apparatus for testing semiconductors, which consists of multiple unitary spring contact probes, insulative guiding holders for mounting the probes, and a retainer mechanism that secures the probes to the holders.
Career Highlights
Wong is currently employed at Asm Assembly Automation Limited, where he continues to develop innovative solutions in the field of electrical testing. His work has been instrumental in advancing the technology used in semiconductor testing, showcasing his commitment to innovation and excellence.
Collaborations
Wong collaborates with talented individuals such as Ching Man Stanley Tsui and Chak Tong Albert Sze. Their combined expertise contributes to the success of their projects and enhances the overall innovation within their field.
Conclusion
Sai Kit Jonathan Wong is a distinguished inventor whose contributions to electrical testing have made a significant impact. His patented spring contact probe device exemplifies his innovative spirit and dedication to improving semiconductor testing technology.