The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
Nov. 26, 2003
Ching Man Stanley Tsui, Kwai Chung, HK;
Chak Tong Albert Sze, Kwai Chung, HK;
Shu Kei Dennis Chan, Kwai Chung, HK;
Sai Kit Jonathan Wong, Kwai Chung, HK;
Ching Man Stanley Tsui, Kwai Chung, HK;
Chak Tong Albert Sze, Kwai Chung, HK;
Shu Kei Dennis Chan, Kwai Chung, HK;
Sai Kit Jonathan Wong, Kwai Chung, HK;
ASM Assembly Automation Ltd., Hong Kong, HK;
Abstract
The invention provides a unitary spring contact probe comprising a resilient spring section, a plunger section extending from a distal end of the resilient spring section for contacting a semiconductor device under test and a stopper projecting from the plunger section substantially transversely to an axial direction of the plunger section. There is also provided an apparatus for testing a semiconductor comprising a plurality of said unitary spring contact probes, one or more insulative guiding holders for mounting the spring contact probes, and a retainer mechanism coupled to the stoppers of the spring contact probes for securing the spring contact probes to the insulative guiding holders.