Sagar Kataria

Title: Sagar Kataria: Innovator in Integrated Circuit Technology

Introduction

Sagar Kataria is a prominent inventor based in Noida, India, known for his contributions to integrated circuit technology. With a total of three patents to his name, he has made significant advancements in the field of electronics and debugging systems.

Latest Patents

One of his latest patents is the LBIST debug controller, which features an integrated circuit that includes a logic built-in self-test (LBIST) system. This system incorporates scan chains that receive clock signals and test pattern signals, generating scan out signals. A debug controller processes these signals, maintaining a dynamic count of debug shift operations and comparing it with a final count to determine fault locations in the IC. Another notable patent is the scan wrapper circuit for integrated circuits, which operates in both internal and external testing modes. This invention includes partitions with scan chains and multiplexers that facilitate the generation of output signals based on scan input signals, enhancing the testing capabilities of integrated circuits.

Career Highlights

Sagar has worked with notable companies in the semiconductor industry, including Freescale Semiconductor, Inc. and NXP USA, Inc. His experience in these organizations has contributed to his expertise in integrated circuit design and testing.

Collaborations

Throughout his career, Sagar has collaborated with talented individuals such as Anurag Jindal and Mayank Parasrampuria, further enriching his professional journey.

Conclusion

Sagar Kataria's innovative work in integrated circuit technology and his contributions through patents highlight his role as a significant inventor in the field. His advancements continue to influence the development of electronic systems and debugging methodologies.