Location History:
- Nakashimojo, JP (1992)
- Yamanashi, JP (1990 - 1994)
Company Filing History:
Years Active: 1990-1994
Title: Innovator Ryuichi Takebuchi: Pioneering Probe Technologies in Yamanashi
Introduction
Ryuichi Takebuchi, a distinguished inventor based in Yamanashi, Japan, has made significant contributions to the field of electronics through his innovative probe technologies. With three patents to his name, Takebuchi has demonstrated a commitment to enhancing the precision and efficiency of electrical measurements in semiconductor manufacturing.
Latest Patents
Among his latest patents is the **Probe Apparatus and Method of Alignment for the Same**. This invention features a probe apparatus designed for measuring the electrical characteristics of chips arranged on a wafer. The system includes a probe card equipped with probe needles and a rotary chuck that supports the wafer. The chuck is mounted on an XY stage, while a stationary alignment bridge houses a stationary camera and a capacitance sensor. The movable camera located on the stage facilitates alignment processes. Additionally, a transparent plate, which holds a formed target made of thin films, is attached to the chuck. This target serves for positioning and focusing of the cameras, while the thin films enable height detection via the capacitance sensor.
Another notable patent is the **Method of Inspecting Electric Characteristics of Wafers and Apparatus**. This method automates the detection for second and subsequent alignment operations of probe cards. The corresponding apparatus allows for the continuous inspection of various wafer types utilizing the same probe card, leveraging prestored alignment data specific to each wafer type.
Career Highlights
Takebuchi has significantly impacted the semiconductor industry through his work at **Tokyo Electron Limited** and **Tokyo Electron Yamanashi Limited**. His efforts at these companies have propelled advancements in wafer testing and electrical characteristic measurement technologies, positioning him as a notable figure in the field.
Collaborations
Throughout his career, Ryuichi Takebuchi has collaborated with esteemed colleagues, including Masaaki Iwamatsu and Yoshihito Marumo. These partnerships have not only fostered innovation but also cultivated a spirit of teamwork and collective problem-solving in their projects.
Conclusion
Ryuichi Takebuchi's contributions to probe technology through his patented inventions showcase his ingenuity and dedication to advancing semiconductor testing. His work continues to influence the industry, ensuring that electrical measurements are executed with greater precision and accessibility. As he pushes the boundaries of innovation, Takebuchi remains a key player in the evolution of electronic testing methodologies.