Company Filing History:
2 out of 2,899 
1 out of 223 
1 out of 832,912 Years Active: 1999-2004
Title: Ryuichi Matsuzaki: Innovator in Probe Scanning Technology
Introduction
Ryuichi Matsuzaki is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of probe scanning technology, holding a total of 4 patents. His innovative designs have advanced the capabilities of scanning instruments, making them more efficient and accurate.
Latest Patents
Matsuzaki's latest patents include a probe scanning device and a scanning probe instrument. The probe scanning device features a first tubular member extending in a z direction, with a second tubular member that defines a space for a viscous material. This design allows for precise movement of the probe tip towards a sample surface. The scanning probe instrument is designed to calibrate measured values accurately, regardless of the magnification factor. It utilizes a scan signal generator and an attenuator to ensure precise length measurements.
Career Highlights
Throughout his career, Ryuichi Matsuzaki has worked with Seiko Instruments Inc, where he has honed his skills in developing advanced scanning technologies. His work has been instrumental in enhancing the performance of various measurement instruments.
Collaborations
Matsuzaki has collaborated with notable coworkers such as Yukihiro Sato and Masatoshi Yasutake. Their combined expertise has contributed to the successful development of innovative technologies in the field.
Conclusion
Ryuichi Matsuzaki's contributions to probe scanning technology have established him as a prominent figure in the field. His patents reflect a commitment to innovation and precision in measurement instruments.