Campinas, Brazil

Rubens Takiguti

This inventor holds 1 USPTO granted patent. Top assignee: Nxp USA, Inc.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rubens Takiguti. Retrieved from https://idiyas.com/inventor/rubens-takiguti

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Rubens Takiguti: Innovator in Integrated Circuit Technology

Introduction

Rubens Takiguti is a notable inventor based in Campinas, Brazil. He has made significant contributions to the field of integrated circuit technology. His innovative work has led to the development of a patent that addresses critical challenges in scan testing.

Latest Patents

Rubens holds a patent for a technology titled "Scan testing and method thereof." This patent describes an integrated circuit that includes clock suppression circuitry. The circuitry can suppress the launch pulse of an at-speed test, preventing scan test data from propagating through a multi-clock cycle combinational logic path. Additionally, it can suppress the capture pulse of an at-speed test, ensuring that scan test data is not latched at the downstream latch during the test.

Career Highlights

Rubens Takiguti is currently employed at NXP USA, Inc., where he continues to work on advancing integrated circuit technologies. His expertise in this area has positioned him as a valuable asset to his company and the industry.

Collaborations

Rubens has collaborated with several talented individuals in his field, including Alexandre Sansigolo Lujan and Milton Hissasi Kataoka. These collaborations have fostered innovation and contributed to the success of their projects.

Conclusion

Rubens Takiguti is a distinguished inventor whose work in integrated circuit technology has made a significant impact. His patent on scan testing showcases his innovative approach to solving complex engineering challenges. His contributions continue to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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